Clamshell test socket
Suitable for BGA, QFN, LGA, QFP, SOP, and other package types
Used for rapid chip verification, testing, programming, and burn-in
Features a manual clamshell design for convenient and efficient operation
Compatible with products featuring pitches from 0.4mm to 1.27mm
Replaceable probes ensure easy maintenance and low costs
Mechanical Specifications
Socket materials: PEEK, PPS, Torlon 4203, PEI
Socket head materials: Aluminum, Copper, POM
Probe type: Spring probe
Operating temperature: -40°C to 125°C
Probe lifespan: 100,000 cycles
Spring force: 20g – 30g per pin
Electrical Specifications
Current: 1A
Resistance: 100mΩ
Bandwidth: > 20GHz @ -1dB
What information do I need for a quote?
Please provide the device or package drawing, pitch, pin count, electrical and mechanical requirements, test conditions, quantity, and target delivery date.
Can this product be customized for my device package?
Customization depends on the package drawing, test requirements, operating conditions, and quantity. Contact our engineering team to confirm feasibility.
How are specifications confirmed?
Review the information on this page and send us your drawings and test requirements. Final specifications are confirmed in the quote or technical agreement.
