60GHz Coaxial High-Frequency Test Socket
Features XTD's proprietary R&D and manufacturing processes, ensuring stable testing performance and a long service life.
Bandwidth: > 60 GHz @ -1 dB; excellent high-frequency, high-speed performance.
Resistance: 50 mΩ (impedance-adjustable design).
Pitch compatibility: 0.4 mm – 1.27 mm.
Test stroke: 0.3 mm – 0.65 mm.
Probe lifespan: 3 million – 8 million cycles (results vary based on testing conditions).
Spring force: 20 g – 30 g per pin.
Operating temperature: -55°C to 155°C (supports tri-temp testing).
Suitable for packages such as BGA, QFN, DFN, LGA, and QFP.
Suitable for RF switches, filters, amplifiers, attenuators, baluns, and RF/microwave components.
Suitable for various testing methods, including manual and automated testing.
Replaceable probes; easy maintenance and low cost.
Test socket and housing material: Aluminum (all-metal housing) with excellent heat dissipation and signal shielding performance.
Probe type: Specialized probe (includes shielding layer).
What information do I need for a quote?
Please provide the device or package drawing, pitch, pin count, electrical and mechanical requirements, test conditions, quantity, and target delivery date.
Can this product be customized for my device package?
Customization depends on the package drawing, test requirements, operating conditions, and quantity. Contact our engineering team to confirm feasibility.
How are specifications confirmed?
Review the information on this page and send us your drawings and test requirements. Final specifications are confirmed in the quote or technical agreement.
